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Method for verification of optical proximity correct

机译:光学接近度正确性的验证方法

摘要

The verification method of optical proximity effect correction of the present invention comprises the steps of: designing a layout of a target pattern; Performing optical proximity effect correction (OPC) on the designed layout; Performing first verification using the line width CD on the layout on which the optical proximity effect correction has been performed; Performing a second verification using a process window on the defect vulnerability point detected in the first verification; And further performing optical proximity effect correction on the point where the defect was detected in the secondary verification.;Validation, Linewidth, and Process Window
机译:本发明的光学邻近效应校正的验证方法包括以下步骤:设计目标图案的布局;以及在设计的布局上执行光学邻近效应校正(OPC);在已经进行了光学邻近效应校正的布局上,使用线宽CD进行第一次验证;使用处理窗口对在第一次验证中检测到的缺陷漏洞点进行第二次验证;并进一步在二次验证中检测到缺陷的点上执行光学邻近效应校正。;验证,线宽和处理窗口

著录项

  • 公开/公告号KR101082103B1

    专利类型

  • 公开/公告日2011-11-10

    原文格式PDF

  • 申请/专利权人

    申请/专利号KR20090059918

  • 发明设计人 최진영;

    申请日2009-07-01

  • 分类号H01L21/027;

  • 国家 KR

  • 入库时间 2022-08-21 17:49:31

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