首页> 外国专利> Method for measuring technical determination of impedance of passive radio frequency identification-chip in transponder to e.g. localize articles, involves calculating impedance of chip from imaginary parts of verification impedances

Method for measuring technical determination of impedance of passive radio frequency identification-chip in transponder to e.g. localize articles, involves calculating impedance of chip from imaginary parts of verification impedances

机译:测量无源射频识别芯片在应答器中对例如射频的阻抗的技术确定方法。本地化文章,涉及从验证阻抗的虚部计算芯片的阻抗

摘要

The method involves determining output of an activation signal, in which a response threshold (Pchip) is reached. Radio frequency identification-chips (1) with complex valued verification impedance with a known real part and a known imaginary part are connected. An output of another activation signal is determined, where another response threshold is achieved in the latter activation signal. Impedance (Zchip) of the chips is calculated from the real part, another real part, imaginary part and another imaginary part of the verification impedance and another verification impedance. An independent claim is also included for an arrangement for implementing the method for measuring technical determination of impedance of the passive radio frequency identification-chip.
机译:该方法包括确定激活信号的输出,在该激活信号中达到响应阈值(Pchip)。连接具有已知实部和虚部已知的复值验证阻抗的射频识别芯片(1)。确定另一个激活信号的输出,其中在后一个激活信号中达到另一个响应阈值。根据验证阻抗和另一验证阻抗的实部,另一实部,虚部和另一虚部来计算芯片的阻抗(Zchip)。还包括用于实现用于测量无源射频识别芯片的阻抗的技术确定的方法的装置的独立权利要求。

著录项

  • 公开/公告号DE102009058173A1

    专利类型

  • 公开/公告日2011-06-16

    原文格式PDF

  • 申请/专利权人 FACHHOCHSCHULE KOELN;

    申请/专利号DE20091058173

  • 发明设计人 KRONBERGER RAINER;

    申请日2009-12-15

  • 分类号H04B17;H04B1/59;G01R27/02;G01R27/28;

  • 国家 DE

  • 入库时间 2022-08-21 17:47:31

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