首页> 外国专利> Electronic circuit`s impedance measuring method for e.g. MOSFET, involves determining error curve for value corresponding to error value and calculating impedance to be estimated for different values of measuring frequency of error value

Electronic circuit`s impedance measuring method for e.g. MOSFET, involves determining error curve for value corresponding to error value and calculating impedance to be estimated for different values of measuring frequency of error value

机译:电子电路的阻抗测量方法,例如MOSFET涉及确定与误差值相对应的值的误差曲线,并计算针对误差值的测量频率的不同值而要估计的阻抗

摘要

The method involves supplying an input of an electronic circuit with alternating voltage with a measuring frequency as test signal. An impedance of the circuit is determined from a reaction of the circuit. A parameter is outputted by a vector network analyzer with reference impedance. A value of the impedance of the circuit is determined depending on characteristics of the circuit. An error curve shown for the analyzer is determined for the value corresponding to an error value. The impedance to be estimated is calculated for different values of the measuring frequency of the error value.
机译:该方法包括向电子电路的输入端提供具有测量频率的交流电压作为测试信号。电路的阻抗由电路的反应确定。矢量网络分析仪以参考阻抗输出参数。根据电路的特性确定电路的阻抗值。确定分析仪显示的误差曲线,以确定与误差值相对应的值。针对误差值的测量频率的不同值来计算要估计的阻抗。

著录项

  • 公开/公告号DE102007016372A1

    专利类型

  • 公开/公告日2007-10-04

    原文格式PDF

  • 申请/专利权人 SUSS MICROTEC TEST SYSTEMS GMBH;

    申请/专利号DE20071016372

  • 发明设计人 RUMIANTSEV ANDREJ;KANEV STOJAN;

    申请日2007-04-03

  • 分类号G01R31/28;G01R27/28;

  • 国家 DE

  • 入库时间 2022-08-21 20:29:09

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