首页> 外国专利> Automatically defect pixels detecting method, for flat panel detector in e.g. digital mammography system, involves recognizing defect pixels depending on appropriate pixel value of mean value and middle deviation of all pixel values

Automatically defect pixels detecting method, for flat panel detector in e.g. digital mammography system, involves recognizing defect pixels depending on appropriate pixel value of mean value and middle deviation of all pixel values

机译:自动缺陷像素检测方法,例如用于平板检测器的数字乳腺X线摄影系统,涉及根据平均值的适当像素值和所有像素值的中间偏差来识别缺陷像素

摘要

The method involves capturing multiple images (1) e.g. dark images, by a detector and generating a noise image the images. An average value of all pixel values of the noise image is determined. An average deviation of all pixel values of the noise image is determined from the average value. The pixel of the detector is recognized as defect pixels depending on an appropriate pixel value within the noise image, of the mean value of all the values and middle deviation of the pixel values. The pixel of the detector is arranged in middle of a predetermined section. Independent claims are also included for the following: (1) an imaging fluoroscopy system comprising a control unit (2) a computer program having a set of instructions for automatically detecting defect pixels in a detector (3) an electronic readable data carrier comprising a set of instructions for automatically detecting defect pixels in the detector.
机译:该方法涉及捕获多个图像(1),例如深色图像,由检测器产生并产生噪声图像的图像。确定噪声图像的所有像素值的平均值。从平均值确定噪声图像的所有像素值的平均偏差。根据噪声图像内的适当像素值,所有值的平均值和像素值的中间偏差,将检测器的像素识别为缺陷像素。检测器的像素布置在预定部分的中间。还包括以下方面的独立权利要求:(1)成像荧光检查系统,其包括控制单元(2)计算机程序,该计算机程序具有用于自动检测检测器中的缺陷像素的一组指令(3)包括一组的电子可读数据载体自动检测检测器中的缺陷像素的指令集。

著录项

  • 公开/公告号DE102010019735A1

    专利类型

  • 公开/公告日2011-11-10

    原文格式PDF

  • 申请/专利权人 SIEMENS AKTIENGESELLSCHAFT;

    申请/专利号DE20101019735

  • 发明设计人 SCHMIDGUNST CHRISTIAN DR.;

    申请日2010-05-07

  • 分类号G03B42/02;G01N23/04;H04N5/325;

  • 国家 DE

  • 入库时间 2022-08-21 17:47:14

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