Pixel testing method, method of correcting output voltage of pixel, defect pixel processing device, defect pixel processing program, defect pixel processing method, and recording medium having program

摘要

A pixel testing method, wherein, in photoelectric transducers in which a plurality of first color pixels for converting brightness of a first color of at least two colors contained in light from an object to be photographed into a voltage and a plurality of second color pixels for converting brightness of a second color into a voltage, one of the plurality of the first color pixel is a tested pixel, and it is determined whether the tested pixel adjacent to at least two second color pixels of the plurality of the second color pixels is a defect pixel, includes: detecting a first voltage difference between two voltages output from the tested pixel and first one of the first color pixels adjacent to first one of the second color pixels which is one of the at least two second color pixels; detecting a second voltage difference between two voltages output from the first one of the second color pixels and second one of second color pixels which is the other of the at least two second color pixels; and determining whether the tested pixel is the defect pixel based on the first voltage difference and the second voltage difference.