首页> 外国专利> FLATNESS DETECTION APPARATUS AND FLATNESS DETECTION METHOD

FLATNESS DETECTION APPARATUS AND FLATNESS DETECTION METHOD

机译:平整度检测装置和平整度检测方法

摘要

PROBLEM TO BE SOLVED: To provide a flatness detection apparatus which is capable of easily detecting flatness in simple configuration, and a flatness detection method.;SOLUTION: A flatness detection apparatus 1 comprises measurement data acquisition means 141 which acquires measurement data from a three-dimensional measuring device 2, first measurement point acquisition means 143 which acquires a first measurement point on a measurement face to be inspected, first shape calculation means 144 which calculates a geometrical shape expression of the measurement face to be inspected from the first measurement point, second measurement point acquisition means 145 which acquires a second measurement point belonging to an adjacent measurement face from the measurement data, second shape calculation means 146 which calculates a geometrical shape expression of the adjacent measurement face from the second measurement point, outer edge calculation means 147 which calculates an intersection line or an intersection point between the measurement face to be inspected and the adjacent measurement face, corrected measurement face calculation means 148 which calculates the geometrical shape expression of a corrected measurement face to be inspected on the basis of the intersection line or the intersection point, and flatness detection means 149 which detects flatness of the face to be inspected on the basis of the geometrical shape expression of the corrected measurement face to be inspected.;COPYRIGHT: (C)2013,JPO&INPIT
机译:解决的问题:提供一种能够以简单的构造容易地检测平坦度的平坦度检测装置和平坦度检测方法。解决方案:平坦度检测装置1包括从三个测量装置中获取测量数据的测量数据获取装置141。尺寸测量装置2,第一测量点获取装置143,其在待检查的测量面上获取第一测量点;第一形状计算装置144,其从第一测量点,计算待检查的测量面的几何形状表示,第二测量点获取装置145从测量数据中获取属于相邻测量面的第二测量点;第二形状计算装置146从第二测量点计算相邻测量面的几何形状表达;外缘计算装置147计算交线o在要检查的测量面与相邻的测量面之间的交点处,校正测量面计算装置148根据交点或交点来计算校正后的待测量测量面的几何形状表达式,以及平坦度检测装置149,其基于校正后的被检查面的几何形状表达来检测被检查面的平坦度。版权所有:(C)2013,日本特许厅&INPIT

著录项

  • 公开/公告号JP2012198069A

    专利类型

  • 公开/公告日2012-10-18

    原文格式PDF

  • 申请/专利权人 SEIKO EPSON CORP;

    申请/专利号JP20110061424

  • 发明设计人 NAGAHASHI TOSHINORI;

    申请日2011-03-18

  • 分类号G01B11/30;

  • 国家 JP

  • 入库时间 2022-08-21 17:44:55

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号