CURRENT PROBE MODELING METHOD, CURRENT PROBE MODEL CREATION DEVICE, SIMULATION METHOD, SIMULATION DEVICE, AND PROGRAM

摘要

PROBLEM TO BE SOLVED: To provide a technology for performing simulation of a BCI test in shorter time.;SOLUTION: A current probe which is used for implantation of bulk current to a transmission line in a BCI test is considered as a voltage source which directly implants the bulk current to the transmission line, and modeled. Thus, the current probe is simulated by a voltage source model 20. The current probe implants the current to a signal line by application of voltage. The current which is implanted in such a way is controlled by combination of a frequency and a voltage amplitude value, stored in table data 25 on the frequency and the voltage amplitude value. Thus, a voltage amplitude value which is combined with the frequency is selected so that a current amplitude value of the current which is actually implanted with the frequency matches to a current amplitude value which is obtained by simulation of a circuit for measurement including the voltage source model 20 and the transmission line.;COPYRIGHT: (C)2012,JPO&INPIT