SEMICONDUCTOR CIRCUIT, SEMICONDUCTOR DEVICE, FAILURE DIAGNOSIS METHOD, AND FAILURE DIAGNOSIS PROGRAM

摘要

PROBLEM TO BE SOLVED: To provide a semiconductor circuit, a semiconductor device, a failure diagnosis method, and a failure diagnosis program, capable of self-diagnosing the failure of the switch of a selection circuit.SOLUTION: To diagnose the failure of the high potential side SW of a cell selection SW 20, a low potential side SW and the high potential side SW are all turned OFF (in all OFF-state) to detect an output voltage Vout. In the case of output voltage Vout=0 V, no failure on the high potential side SW is determined. In the case of output voltage Vout0 V, a failure on the high potential side SW is determined. To diagnose a failure on the low potential side SW, a test switch TSW5 is turned ON in the all OFF-state, and a voltage VREF is supplied from a voltage supply unit 24 to a wire 25 to determine an output voltage Vout. In the case of output voltage Vout=1/2 VREF, no failure on the low potential side SW is determined. In the case of output voltage Vout1/2 VREF, a failure on the low potential side SW is determined.