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OPTICAL COMPONENT, FORMATION METHOD THEREOF, AND INFRARED DETECTOR

机译:光学组件,其形成方法和红外探测器

摘要

PROBLEM TO BE SOLVED: To provide an optical component capable of reducing occurrence of cracks and peelings of an antireflection layer, a formation method thereof, and an infrared detector; preventing a partial abnormality in refractive index of a germanium lens caused by cracks and peelings of the antireflection layer due to difference in thermal coefficients of expansion between the germanium lens and the antireflection layer or insufficient adhesion for use, for example, under an ultralow temperature environment including a low temperature environment which are favorable for the germanium lens to reduce amount of infrared radiated from the germanium lens itself.;SOLUTION: An optical component including germanium material is treated with mixed chemicals of hydrofluoric acid and hydrogen peroxide solution to form a porous antireflection layer. The formed antireflection layer is intrinsically integrated to the optical component and capable of reducing cracks and peelings.;COPYRIGHT: (C)2012,JPO&INPIT
机译:解决的问题:提供一种能够减少防反射层的裂纹和剥离的发生的光学部件,其形成方法和红外检测器;防止由于锗透镜与抗反射层之间的热膨胀系数不同或由于在例如超低温环境下使用而导致的粘附力不足而导致的抗反射层的裂纹和剥离引起的锗透镜的折射率的局部异常包括有利于减少锗透镜本身发出的红外光的低温环境。;解决方案:将含锗材料的光学组件用氢氟酸和过氧化氢溶液的混合化学物质处理,以形成多孔抗反射层。形成的防反射层本质上集成到光学组件中,并能够减少裂纹和剥离。;版权所有:(C)2012,JPO&INPIT

著录项

  • 公开/公告号JP2012103454A

    专利类型

  • 公开/公告日2012-05-31

    原文格式PDF

  • 申请/专利权人 FUJITSU LTD;

    申请/专利号JP20100251530

  • 发明设计人 WATANABE SATORU;

    申请日2010-11-10

  • 分类号G02B1/11;G02B17/08;G02B13/18;

  • 国家 JP

  • 入库时间 2022-08-21 17:42:20

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