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Device for inspecting a micro structure, the inspection program of inspection method and micro structure of the micro structure

机译:用于检查微观结构的装置,检查方法的检查程序以及该微观结构的微观结构

摘要

PROBLEM TO BE SOLVED: To provide an inspection device, an inspection method and an inspection program for detecting accurately a structure having a micro movable part by a simple system.;SOLUTION: A test sound wave is output from a speaker 2. The movable part of a triaxial acceleration sensor which is a micro structure of a detection chip TP is moved by arrival of the test sound wave which is a compressional wave output from the speaker 2, namely, by air vibration. A change of a resistance value changing based on the movement is measured based on an output voltage applied through a probe needle 4. A control part 20 determines a characteristic of the triaxial acceleration sensor based on a measured characteristic value, namely, measured data.;COPYRIGHT: (C)2007,JPO&INPIT
机译:解决的问题:提供一种检查装置,检查方法和检查程序,该检查装置,检查方法和检查程序通过简单的系统准确地检测具有微动部的结构。解决方案:从扬声器2输出测试声波。通过从扬声器2输出的压缩波即测试声波的到来,即通过空气振动,使作为检测芯片TP的微结构的三轴加速度传感器的传感器B1移动。基于通过探针4施加的输出电压,测量基于该移动而变化的电阻值的变化。控制部20基于测量的特性值即测量数据来确定三轴加速度传感器的特性。版权:(C)2007,日本特许厅&INPIT

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