Active metric learning device, active metric learning method, and active metric learning program

摘要

An active metric learning device and the like capable of appropriately setting a hierarchical structure of attributes and a granularity of the hierarchy are provided. An active metric learning device according to the present invention includes a metric application data analysis unit that calculates a distance between analysis target data and a predetermined function using a distance between the analysis target data. Data analysis means 220 for analyzing data and outputting data analysis results, and analysis result storage means 250 for storing the data analysis results, and the metric optimization unit 300 generates side information from a feedback instruction from the user Feedback conversion means 310 and metric learning means 330 for generating a metric matrix optimized based on a predetermined condition from the generated side information, and the attribute clustering unit 500 is optimized by the metric optimization unit The attribute metrics are structured by clustering the metric matrices. [Selection] Figure 1