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Two-dimensional position detection method of radiation using the same and semiconductor detector to detect a two-dimensional position of the radiation

机译:使用放射线的二维位置检测方法以及半导体检测器来检测放射线的二维位置

摘要

2-dimensional position detector 1 semiconductor for detecting a two-dimensional position of the radiation were juxtaposed at a predetermined interval in the X-direction surface of the semiconductor substrate (2), a semiconductor substrate (2) and (2A), (n is an integer of 2 or more) from the Schottky diode, and a (15) electrodes were formed on the back stripe electrode (3), a semiconductor substrate (2) and (2B) first through n-th parallel to the Y-direction The result, it is possible to connect in sequence each via (4, 5) resistance to both end portions between the stripe electrodes (3), from the ends of (3) stripe electrodes of the n first and which is disposed at both ends, the semiconductor I extracting signals output signal V 1 ~V 4 radiation from (16) that is incident on the substrate (2).
机译:在半导体基板(2),半导体基板(2)和(2A)的X方向表面上以预定间隔并列设置有用于检测放射线的二维位置的二维位置检测器1。是从肖特基二极管(2或更大的整数)开始的,并且在与Y-平行的后条纹电极(3),半导体衬底(2)和(2B)上至第n处形成(15)个电极。方向的结果是,可以从第n个条形电极的(3)条形电极的端部起依次将每个通孔(4、5)电阻依次连接到条形电极(3)的两端部。最后,半导体I提取信号从入射到衬底(2)上的(16)输出信号 V 1〜V 4 辐射。

著录项

  • 公开/公告号JPWO2010064693A1

    专利类型

  • 公开/公告日2012-05-10

    原文格式PDF

  • 申请/专利权人 国立大学法人東北大学;

    申请/专利号JP20100541355

  • 发明设计人 菊池 洋平;石井 慶造;

    申请日2009-12-03

  • 分类号G01T1/24;G01T1/161;

  • 国家 JP

  • 入库时间 2022-08-21 17:36:04

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