Position Sensitive Detector Used to Detect Beam Profile

摘要

Non-destructive diagnostic methods are very important for beam adjustments and monitors,especially when the beam intensity is less than 10~8 pps during the heavy-ion treatment of cancer.Now the diagnostic devices of HIFRL can’t satisfy the requests,so we decide to construct a detecting system of the residual-gas beam profile^([1,2]).The system uses the Position Sensitive Detector(PSD)^([3,4])based on microchannel plate(MCP)