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The work measurement inspecting system and work measurement inspection manner

机译:工作计量检查系统和工作计量检查方式

摘要

PROBLEM TO BE SOLVED: To provide a system and method of measuring and inspecting workpieces, capable of accurately measuring electrical characteristics of workpieces, facilitating probe adjustment, suppressing halation on electrodes due to light applied to workpieces for visual inspection of work pieces, and thus assuring the visual inspection of workpieces.;SOLUTION: A light transmittable member 7 is provided on the cover mechanism 6. In measurement of electric characteristics of a workpiece W, probes 13a and 13b move to the light transmittable member 7 until a workpiece W on the probes 13a and 13b abuts on the lower surface 7a of the light transmittable member 7. A measuring instrument 21 measures the electrical characteristics of the workpiece W abutting on the lower surface 7a of the light transmittable member 7 through the probes 13a and 13b. Further, the lower surface 7a of the light transmittable member 7 is rough.;COPYRIGHT: (C)2009,JPO&INPIT
机译:解决的问题:提供一种测量和检查工件的系统和方法,该系统和方法能够准确地测量工件的电气特性,促进探针调整,抑制由于施加到工件上的光而对电极造成的光晕,从而对工件进行目视检查,从而确保解决方案:在盖机构6上设置透光部件7。在测量工件W的电特性时,探针13a和13b移动到透光部件7,直到探针上的工件W为止。如图13a和13b所示,在透光构件7的下表面7a上抵接。测量仪器21通过探针13a,13b对抵接在透光构件7的下表面7a上的工件W的电特性进行测量。另外,透光部件7的下表面7a是粗糙的。​​版权所有:(C)2009,日本特许厅&INPIT

著录项

  • 公开/公告号JP4870008B2

    专利类型

  • 公开/公告日2012-02-08

    原文格式PDF

  • 申请/专利权人 株式会社 東京ウエルズ;

    申请/专利号JP20070085184

  • 发明设计人 松 岡 保 夫;

    申请日2007-03-28

  • 分类号G01N21/85;

  • 国家 JP

  • 入库时间 2022-08-21 17:35:51

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