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HETEROSTRUCTURES COMPRISING CRYSTALLINE STRAIN RELAXATION LAYERS

机译:包含晶体应变松弛层的异质结构

摘要

The invention relates to a process for fabricating a heterostructure. This process is noteworthy in that it comprises the following steps: a) a strained crystalline thin film is deposited on, or transferred onto, an intermediate substrate; b) a strain relaxation layer, made of crystalline material capable of being plastically deformed by a heat treatment at a relaxation temperature at which the material constituting the thin film deforms by elastic deformation is deposited on the thin film; c) the thin film and the relaxation layer are transferred onto a substrate; and d) a thermal budget is applied at at least the relaxation temperature, so as to cause the plastic deformation of the relaxation layer and the at least partial relaxation of the thin film by elastic deformation, and thus to obtain the final heterostructure.
机译:本发明涉及一种制造异质结构的方法。该过程值得注意,因为它包括以下步骤:a)将应变的晶体薄膜沉积或转移到中间基板上; b)由晶体材料制成的应变松弛层沉积在薄膜上,该晶体材料能够通过在松弛温度下通过热处理而塑性变形,在松弛温度下构成薄膜的材料通过弹性变形而变形; c)将薄膜和松弛层转移到基底上; d)至少在松弛温度下施加热预算,以通过弹性变形引起松弛层的塑性变形和薄膜的至少部分松弛,从而获得最终的异质结构。

著录项

  • 公开/公告号US2012098033A1

    专利类型

  • 公开/公告日2012-04-26

    原文格式PDF

  • 申请/专利权人 BRUCE FAURE;

    申请/专利号US201113341489

  • 发明设计人 BRUCE FAURE;

    申请日2011-12-30

  • 分类号H01L29/04;

  • 国家 US

  • 入库时间 2022-08-21 17:33:06

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