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Fine pitch guided vertical probe array having enclosed probe flexures

机译:细间距导向的垂直探头阵列,具有封闭的探头弯曲

摘要

Probes suitable for use with densely packed fine-pitch 2-D contact arrays are provided by use of an electrically insulating guide plate in connection with vertical probes, where the vertical probes have probe flexures that are either vertically folded sections, or coils having a horizontal axis. Preferably, the probes are configured such that the probe flexures are inside the guide plate holes, and the parts of the probes extending past the guide plate are relatively rigid. This configuration alleviates problems associate with probe shorting, because the probe flexures are enclosed by the guide plate holes, and are therefore unable to come into contact with flexures from other probes during probing.
机译:通过与垂直探头连接使用电绝缘导板,可以提供适用于密集排列的细间距2-D触点阵列的探头,其中垂直探头的探头弯曲部分是垂直折叠的部分,或者是具有水平线圈的线圈轴。优选地,探针被构造成使得探针挠曲在引导板孔内,并且探针的延伸超过引导板的部分是相对刚性的。这种结构减轻了与探针短路有关的问题,因为探针挠曲被导向板孔包围,因此在探测过程中不能与其他探针的挠曲接触。

著录项

  • 公开/公告号US2012194212A1

    专利类型

  • 公开/公告日2012-08-02

    原文格式PDF

  • 申请/专利权人 JANUARY KISTER;

    申请/专利号US20110931260

  • 发明设计人 JANUARY KISTER;

    申请日2011-01-27

  • 分类号G01R31/00;

  • 国家 US

  • 入库时间 2022-08-21 17:32:53

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