首页> 外国专利> INVERTED-TRENCH GROUNDED-SOURCE FET STRUCTURE USING CONDUCTIVE SUBSTRATES, WITH HIGHLY DOPED SUBSTRATES

INVERTED-TRENCH GROUNDED-SOURCE FET STRUCTURE USING CONDUCTIVE SUBSTRATES, WITH HIGHLY DOPED SUBSTRATES

机译:导电基底和高掺杂基底的反沟道地源场效应管结构

摘要

This invention discloses an inverted field-effect-transistor (iT-FET) semiconductor device that includes a source disposed on a bottom and a drain disposed on a top of a semiconductor substrate. The semiconductor power device further comprises a trench-sidewall gate placed on sidewalls at a lower portion of a vertical trench surrounded by a body region encompassing a source region with a low resistivity body-source structure connected to a bottom source electrode and a drain link region disposed on top of said body regions thus constituting a drift region. The drift region is operated with a floating potential said iT-FET device achieving a self-termination.
机译:本发明公开了一种反向场效应晶体管(iT-FET)半导体器件,其包括布置在半导体衬底的底部上的源极和布置在半导体衬底的顶部上的漏极。该半导体功率器件还包括沟槽侧壁栅极,该沟槽侧壁栅极放置在垂直沟槽的下部的侧壁上,该侧壁被主体区域围绕,该主体区域包含具有低电阻率的主体-源极结构的源极区域,该主体-源极结构连接至底部源电极和漏极连接区域设置在所述主体区域的顶部上,从而构成漂移区域。所述漂移区在浮置电位下操作,所述iT-FET器件实现自终止。

著录项

  • 公开/公告号US2012282746A1

    专利类型

  • 公开/公告日2012-11-08

    原文格式PDF

  • 申请/专利权人 FRANÇOIS HÉBERT;

    申请/专利号US201213553152

  • 发明设计人 FRANÇOIS HÉBERT;

    申请日2012-07-19

  • 分类号H01L21/336;

  • 国家 US

  • 入库时间 2022-08-21 17:32:32

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