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METAL AND SEMIMETAL SENSORS NEAR THE METAL INSULATOR TRANSITION REGIME

机译:金属绝缘子过渡区附近的金属和半金属传感器

摘要

This invention generally relates to sensors made of granular thin films in the discontinuous phase. More particularly, the invention relates to microbolometers and displacement sensors fabricated from thin films that are close to the metal insulator transition (MIT) or metal semiconductor transition (MST) regime. Sensors of various designs have been fabricated according to the invention and may be used for deflection measurements, nano-indentation, visco-elastic measurements, topographical scanning, explosive detection, low abundance biomolecular detection, electromagnetic radiation detection and other similar detection and measurement systems.
机译:本发明总体上涉及不连续相中由颗粒状薄膜制成的传感器。更具体地,本发明涉及由接近金属绝缘体转变(MIT)或金属半导体转变(MST)方案的薄膜制成的测微辐射热计和位移传感器。根据本发明已经制造了各种设计的传感器,并且可以将其用于挠曲测量,纳米压痕,粘弹性测量,形貌扫描,爆炸物检测,低丰度生物分子检测,电磁辐射检测以及其他类似的检测和测量系统。

著录项

  • 公开/公告号US2012223804A1

    专利类型

  • 公开/公告日2012-09-06

    原文格式PDF

  • 申请/专利权人 ANGELO GAITAS;

    申请/专利号US201213469724

  • 发明设计人 ANGELO GAITAS;

    申请日2012-05-11

  • 分类号H01C1/012;

  • 国家 US

  • 入库时间 2022-08-21 17:32:05

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