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Analysis method using finite element method, program causing computer to execute same, and system for same

机译:使用有限元方法的分析方法,使计算机执行该程序的程序及其系统

摘要

An FEM analysis system is provided which is capable of analyzing with high accuracy and within a short time in a drop shock analysis of electronic devices in which a very small mesh size is incorporated. Processing to be performed by an optimal solution selecting and analyzing section includes a step of checking whether an analysis to be performed is a shock analysis, a step of searching for a minimum mesh size when the analysis to be performed is judged to be a shock analysis, a step of creating a simplified analysis model using the minimum mesh size, a step of performing a preliminary analysis on a simplified model by an implicit method and explicit method, and a step of selecting either of the implicit method or explicit method as an optimal analysis method by comparing results from preliminary analysis, results from these analyses and experiments or exact solution.
机译:提供了一种FEM分析系统,该系统能够在结合了非常小的网眼尺寸的电子设备的跌落冲击分析中以高准确度并且在短时间内进行分析。由最优解选择和分析部执行的处理包括检查要执行的分析是否是冲击分析的步骤,当要执行的分析被判断为冲击分析时搜索最小网格尺寸的步骤。 ,使用最小网格尺寸创建简化分析模型的步骤,通过隐式方法和显式方法对简化模型进行初步分析的步骤以及选择隐式方法或显式方法中的任意一种作为最佳方法的步骤通过比较初步分析的结果,这些分析和实验的结果或精确解的分析方法。

著录项

  • 公开/公告号US8229712B2

    专利类型

  • 公开/公告日2012-07-24

    原文格式PDF

  • 申请/专利权人 ICHIRO HIRATA;

    申请/专利号US20090461580

  • 发明设计人 ICHIRO HIRATA;

    申请日2009-08-17

  • 分类号G06F17/50;

  • 国家 US

  • 入库时间 2022-08-21 17:29:01

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