Method for acquiring basic characteristic of simultaneous switching noise in method for estimating simultaneous switching noise on semiconductor device

摘要

In an initial stage of device design, a circuit analysis control unit of an evaluation board stores SSO noise basic characteristic data actually measured by the evaluation board in an SSO noise basic characteristic data storage unit, and an SSO noise calculation unit calculates a rough amount of SSO noise on the basis of the SSO noise basic characteristic data. After a noise check is OR, the design proceeds, and a PCB parameter is determined, a circuit analysis control unit acquires the SSO noise basic characteristic data according to actual device PCB design information, and corrects the SSO noise basic characteristic data in the SSO noise basic characteristic data storage unit. Then, the SSO noise calculation unit performs a detailed analysis of an amount of SSO noise using the corrected SSO noise basic characteristic data.