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System and methods for controlling properties of nanojunction devices

机译:用于控制纳米结器件特性的系统和方法

摘要

An exemplary, highly integrated, SPM-based system for measuring the conductivity and/or force of substance under programmable engaging/stretching processes is described. A sample bias is applied across two electrodes. A substance to be measured is sandwiched between them. A first electrode is first brought relative to a second electrode (engaging) in programmable pathways that can be described as stretching distance versus time curves. The process of engaging the electrodes continues until a certain current reached, a certain force reached and whichever case happens first. The electrodes are then separated (stretching) in programmable pathways that can be described as stretching distance versus time curves. A periodic modulation can be applied to the engaging/stretching process to realize different stretch pathways. The sample bias across the electrodes is kept constant or swept in a programmable shape over time, described as a voltage-versus time curve. The conductivity, engaging/stretching distance, and/or force are measured simultaneously.
机译:描述了示例性的,高度集成的,基于SPM的系统,该系统用于在可编程的接合/拉伸过程下测量物质的电导率和/或力。跨两个电极施加样品偏压。将要测量的物质夹在它们之间。首先将第一电极相对于第二电极引入(接合)在可编程路径中,该路径可描述为拉伸距离与时间的关系曲线。接合电极的过程一直持续到达到一定的电流,达到一定的力并且无论哪种情况先发生。然后在可编程路径中将电极分开(拉伸),该路径可描述为拉伸距离与时间的关系曲线。可以将周期性调制应用于接合/拉伸过程以实现不同的拉伸路径。电极上的样品偏压保持恒定或随时间以可编程形状扫描,称为电压与时间曲线。同时测量导电率,接合/拉伸距离和/或力。

著录项

  • 公开/公告号US8196218B2

    专利类型

  • 公开/公告日2012-06-05

    原文格式PDF

  • 申请/专利权人 BINGQIAN XU;FAN CHEN;

    申请/专利号US20090414069

  • 发明设计人 FAN CHEN;BINGQIAN XU;

    申请日2009-03-30

  • 分类号G01Q60/40;

  • 国家 US

  • 入库时间 2022-08-21 17:26:30

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