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Method for determining self-heating free I-V characterstics of a transistor
Method for determining self-heating free I-V characterstics of a transistor
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机译:确定晶体管的自发热自由I-V特性的方法
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摘要
According to one exemplary embodiment, a method for determining a self-heating free drain current in a transistor corresponding to a channel temperature not affected by a drain DC current includes measuring at least three unique drain currents of a transistor corresponding to at least three unique ambient temperatures. The method further includes determining at least three unique channel temperatures of the transistor corresponding to the at least three unique drain currents, thereby establishing a current-temperature relationship for the transistor. The method further includes determining the self-heating free drain current of the transistor utilizing the current-temperature relationship.
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