首页>
外国专利>
A CALIBRATION STANDARD DEVICE FOR CALIBRATION OF INSTRUMENTS FOR NON-DESTRUCTIVE MEASUREMENTS OF THICKNESS OF THIN LAYERS
A CALIBRATION STANDARD DEVICE FOR CALIBRATION OF INSTRUMENTS FOR NON-DESTRUCTIVE MEASUREMENTS OF THICKNESS OF THIN LAYERS
展开▼
机译:用于对薄层厚度进行非破坏性测量的仪器校准的校准标准装置
展开▼
页面导航
摘要
著录项
相似文献
摘要
The invention relates to a calibration standard, especially for the calibration of devices for the non-destructive measurement of the thickness of thin layers with a carrier plate (16) of a basic material and a standard (17) applied on the carrier plate (16), said standard having the thickness of the layer at which the device is to be calibrated, wherein that a holding device (22) arranged on the basic body (12) of the calibration standard (11) receives at least the standard (17) to the basic body (12) such that upon setting a measuring probe of the device for the non-destructive measurement of thin layers onto the standard (17), its position will be changeable by at least one degree of freedom.
展开▼