首页> 外国专利> ON-CHIP POLARIMETRY FOR HIGH-THROUGHPUT SCREENING OF NANOLITER AND SMALLER SAMPLE VOLUMES

ON-CHIP POLARIMETRY FOR HIGH-THROUGHPUT SCREENING OF NANOLITER AND SMALLER SAMPLE VOLUMES

机译:芯片上极化法用于纳米颗粒和较小样品体积的高通量筛选

摘要

A polarimetry technique for measuring optical activity that is particularly suited for high throughput screening employs a chip or substrate (22) having one or more microfluidic channels (26) formed therein. A polarized laser beam (14) is directed onto optically active samples that are disposed in the channels. The incident laser beam interacts with the optically active molecules in the sample, which slightly alter the polarization of the laser beam as it passes multiple times through the sample. Interference fringe patterns (28) are generated by the interaction of the laser beam with the sample and the channel walls. A photodetector (34) is positioned to receive the interference fringe patterns and generate an output signal that is input to a computer or other analyzer (38) for analyzing the signal and determining the rotation of plane polarized light by optically active material in the channel from polarization rotation calculations.
机译:特别适合于高通量筛选的用于测量光学活性的旋光技术采用其中形成有一个或多个微流体通道(26)的芯片或基板(22)。偏振激光束(14)对准设置在通道中的光学活性样品。入射激光束与样品中的旋光分子相互作用,当激光束多次穿过样品时,它们会稍微改变激光束的偏振。干涉条纹图案(28)是由激光束与样品和通道壁的相互作用产生的。放置光检测器(34)以接收干涉条纹图案并生成输出信号,该输出信号输入到计算机或其他分析器(38)中,以分析该信号并通过通道中的光学活性材料确定平面偏振光的旋转。极化旋转计算。

著录项

  • 公开/公告号EP1805498A4

    专利类型

  • 公开/公告日2012-07-04

    原文格式PDF

  • 申请/专利权人 VANDERBILT UNIVERSITY;

    申请/专利号EP20050821243

  • 申请日2005-10-24

  • 分类号G01N15/06;B01L9/00;B32B5/02;G01B9/02;G01J4/04;G01N21/21;G01N21/45;

  • 国家 EP

  • 入库时间 2022-08-21 17:17:31

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