首页> 外国专利> PROCESSES TO FORM AQUEOUS PRECURSORS, HAFNIUM AND ZIRCONIUM OXIDE FILMS, AND HAFNIUM AND ZIRCONIUM OXIDE PATTERNS

PROCESSES TO FORM AQUEOUS PRECURSORS, HAFNIUM AND ZIRCONIUM OXIDE FILMS, AND HAFNIUM AND ZIRCONIUM OXIDE PATTERNS

机译:形成水性前体,氧化HA和氧化锆膜以及氧化HA和氧化锆图案的过程

摘要

Embodiments of a method for synthesizing aqueous precursors comprising Hf4+ or Zr4+ cations, peroxide, and a monoprotic acid are disclosed. The aqueous precursors are suitable for making HfO2 and ZrO2 thin films, which subsequently can be patterned. The disclosed thin films are dense and continuous, with a surface roughness of ≤ 0.5 nm and a refractive index of 1.85-2.0 at λ = 550 nm. Some embodiments of the disclosed thin films have a leakage-current density ≤ 20 nA/cm2 at 1 MV/cm, with a dielectric breakdown ≥ 3 MV/cm. The thin films can be patterned with radiation to form dense lines and space patterns.
机译:公开了包含Hf 4 + 或Zr 4 + 阳离子,过氧化物和单质子酸的水性前体的合成方法的实施方案。水性前体适合于制备HfO 2 和ZrO 2 薄膜,随后可以对其进行构图。所公开的薄膜是致密且连续的,其表面粗糙度≤0.5nm,并且在λ= 550nm处的折射率为1.85-2.0。所公开的薄膜的一些实施例在1MV / cm下具有≤20nA/ cm 2 的漏电流密度,并且介电击穿≥3MV/ cm。可以利用辐射使薄膜图案化以形成密集的线和空间图案。

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