X-Ray Fluorescence Analysis for Hafnium and Zirconium in Mixtures of Their Chlorides, Carbides, and Oxides

摘要

An x-ray fluorescence technique for analyses of mixtures of hafnium and zirconium oxides is described. The basic procedures are extended to include mixed carbides and mixed chlorides. The use of the silicon (111) spectrometer crystal effectively eliminates the usual interference of the second-order zirconium K spectrum with the first-order hafnium L spectrum. Good accuracy and precision are obtained in the range from 0.5 to 99.5 wt % ZrO2. (Author)