首页> 外国专利> LED CHIP FAULT INSPECTION AND AN APPARATUS FOR INSPECTING AND DISCHARGING AN LED CHIP CAPABLE OF AUTOMATICALLY SORTING AND DISCHARGING AN LED CHIP FROM A LEAD FRAME

LED CHIP FAULT INSPECTION AND AN APPARATUS FOR INSPECTING AND DISCHARGING AN LED CHIP CAPABLE OF AUTOMATICALLY SORTING AND DISCHARGING AN LED CHIP FROM A LEAD FRAME

机译:LED芯片故障检查以及用于检查和放电能够自动从铅框架中对LED芯片进行排序和放电的LED芯片的设备

摘要

PURPOSE: An LED chip fault inspection and an apparatus for inspecting and discharging an LED chip are provided to fundamentally prevent a fault LED chip from being processed in following processes by immediately eliminating a fault LED chip which is selected in an inspection process.;CONSTITUTION: An apparatus for inspecting and discharging an LED chip comprises a loading part(100), a testing part(200), a chip discharging part(300), and an unloading part(400). The loading part supplies a lead frame which packages an LED chip. The testing part inspects the fault of each LED chip which is packaged in the lead frame provided in the loading part. The chip discharging part receives tested data. The position of a fault LED chip is checked with data. The fault LED chip is separated from the lead frame and discharged. The unloading part takes out the lead frame which is delivered from the chip discharging part.;COPYRIGHT KIPO 2012
机译:目的:提供一种LED芯片故障检查以及一种检查和放电LED芯片的设备,通过立即消除在检查过程中选择的故障LED芯片,从根本上防止故障LED芯片在后续过程中被处理。用于检查和排出LED芯片的设备包括装载部分(100),测试部分(200),芯片排出部分(300)和卸载部分(400)。加载部分提供封装LED芯片的引线框架。测试部分检查封装在装载部分中提供的引线框架中的每个LED芯片的故障。排屑部分接收测试数据。用数据检查故障LED芯片的位置。故障LED芯片与引线框架分离并放电。卸载部分取出从排屑部分送出的引线框架。; COPYRIGHT KIPO 2012

著录项

  • 公开/公告号KR20110123177A

    专利类型

  • 公开/公告日2011-11-14

    原文格式PDF

  • 申请/专利权人 SUNGDO HIGH TECH CO. LTD.;

    申请/专利号KR20100042671

  • 发明设计人 KIM KYUNG CHUL;

    申请日2010-05-06

  • 分类号G01R31/26;H01L21/66;G01R1/02;

  • 国家 KR

  • 入库时间 2022-08-21 17:11:44

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