首页> 外国专利> METHOD FOR FORMATION OF LDD OF THIN FILM TRANSISTOR, A METHOD FOR FABRICATION OF A THIN FILM TRANSISTOR AND AN ORGANIC LIGHT EMITTING DEVICE USING THE SAME, CAPABLE OF REDUCING LEAKAGE CURRENT

METHOD FOR FORMATION OF LDD OF THIN FILM TRANSISTOR, A METHOD FOR FABRICATION OF A THIN FILM TRANSISTOR AND AN ORGANIC LIGHT EMITTING DEVICE USING THE SAME, CAPABLE OF REDUCING LEAKAGE CURRENT

机译:薄膜晶体管的LDD的形成方法,薄膜晶体管的制造方法以及使用该薄膜晶体管的有机发光装置,能够降低漏电流

摘要

PURPOSE: A method for formation of LDD of thin film transistor, a method for fabrication of a thin film transistor and an organic light emitting device using the same are provided to symmetrically form the LDD of a bottom-gate type thin film transistor by forming a lightly doped drain for LDD.;CONSTITUTION: A gate electrode(21) is formed on the front side of a substrate(11). The gate insulating layer(22) is formed on the gate electrode and substrate. An active layer(23) is formed on the gate insulating layer. The low density ion is inserted into the active layer from the back side of the substrate. The lightly doped drain and heavily doped impurity region are formed within the active layer.;COPYRIGHT KIPO 2012
机译:目的:提供一种用于形成薄膜晶体管的LDD的方法,一种用于制造薄膜晶体管的方法以及使用该方法的有机发光器件,以通过形成薄膜晶体管来对称地形成底栅型薄膜晶体管的LDD。用于LDD的轻掺杂漏极;组成:在基板(11)的正面形成栅电极(21)。栅绝缘层(22)形成在栅电极和基板上。有源层(23)形成在栅极绝缘层上。低密度离子从衬底的背面插入到有源层中。在有源层中形成轻掺杂漏极和重掺杂杂质区。; COPYRIGHT KIPO 2012

著录项

  • 公开/公告号KR20120004789A

    专利类型

  • 公开/公告日2012-01-13

    原文格式PDF

  • 申请/专利权人 SAMSUNG MOBILE DISPLAY CO. LTD.;

    申请/专利号KR20100065464

  • 发明设计人 KIM YOUNG IL;

    申请日2010-07-07

  • 分类号H01L29/786;G02F1/136;H01L51/50;

  • 国家 KR

  • 入库时间 2022-08-21 17:10:46

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