首页> 外国专利> SEMICONDUCTOR DEVICE AND A MANUFACTURING METHOD THEREOF EQUIPPED WITH A OXYGEN TRAPPING FILM CAPABLE OF IMPROVING A NARROW WIDTH EFFECT OF THE SEMICONDUCTOR DEVICE

SEMICONDUCTOR DEVICE AND A MANUFACTURING METHOD THEREOF EQUIPPED WITH A OXYGEN TRAPPING FILM CAPABLE OF IMPROVING A NARROW WIDTH EFFECT OF THE SEMICONDUCTOR DEVICE

机译:半导体器件及其制造方法,该器件具有能够改善半导体器件的窄幅效应的氧捕捉膜。

摘要

PURPOSE: A semiconductor device and a manufacturing method thereof are provided to control a threshold voltage of a transistor to be increased by forming an oxygen trapping film on the upper side of a gate electrode and an active area.;CONSTITUTION: An element isolation film limiting an active area(5) is formed on a substrate(1). A gate electrode(9) is formed on the active area. A gate insulating layer(7) is formed between the gate electrode and the active area. A spacer(11) is formed on the side of the gate electrode. An oxygen trapping film(15a) is formed on the substrate which includes the gate electrode. An inter-layer insulating film(17) is formed on the oxygen trapping film. A contact etching stop film is formed between the oxygen trapping film and the inter-layer insulating film.;COPYRIGHT KIPO 2012
机译:目的:提供一种半导体器件及其制造方法,以通过在栅电极和有源区的上侧形成氧俘获膜来控制晶体管的阈值电压升高;组成:元件隔离膜限制在衬底(1)上形成有源区(5)。在有源区上形成栅电极(9)。在栅电极和有源区之间形成栅绝缘层(7)。在栅电极的侧面上形成隔离物(11)。在包括栅电极的基板上形成氧捕获膜(15a)。在氧俘获膜上形成层间绝缘膜(17)。在氧捕获膜和层间绝缘膜之间形成接触蚀刻停止膜。; COPYRIGHT KIPO 2012

著录项

  • 公开/公告号KR20120076084A

    专利类型

  • 公开/公告日2012-07-09

    原文格式PDF

  • 申请/专利权人 SAMSUNG ELECTRONICS CO. LTD.;

    申请/专利号KR20100138077

  • 发明设计人 JEONG YONG KUK;

    申请日2010-12-29

  • 分类号H01L21/336;H01L29/78;

  • 国家 KR

  • 入库时间 2022-08-21 17:09:36

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