首页> 外国专利> MANUFACTURING METHOD OF RUTHENIUM CAPPED SILICIDE NANOWIRE CAPABLE OF CONTROLLING THE THICKNESS OF A CAPPING

MANUFACTURING METHOD OF RUTHENIUM CAPPED SILICIDE NANOWIRE CAPABLE OF CONTROLLING THE THICKNESS OF A CAPPING

机译:能够控制覆盖层厚度的钌包覆硅化物纳米线的制造方法

摘要

PURPOSE: A manufacturing method of ruthenium capped silicide nanowire is provided to use ruthenium as a capping layer by using an atomic layer deposition process.;CONSTITUTION: A manufacturing method of ruthenium capped silicide nanowire comprises the following step: evaporating a cobalt atomic layer thin film on a silicon nano wire substrate using an atomic layer deposition; and evaporating the ruthenium on silicon nano wire in which cobalt is vaporized for capping the ruthenium using the atomic layer deposition process. The ruthenium capping step comprises the following steps: injecting and evaporating DER(2,4-dimethylpentadienyl ethylcyclopentadienyl ruthenium) on the nano wire substrate as a precursor; washing with argon gas; injecting O2 as a reactant into a reactor; and washing with argon gas.;COPYRIGHT KIPO 2012
机译:目的:提供一种钌包覆硅化物纳米线的制备方法,以通过原子层沉积工艺将钌用作包覆层。组成:钌包覆硅化物纳米线的制备方法包括以下步骤:蒸发钴原子层薄膜使用原子层沉积在硅纳米线基板上;蒸发硅纳米线上的钌,在该纳米线中蒸发了钴以使用原子层沉积工艺来覆盖钌。钌封端步骤包括以下步骤:将DER(2,4-二甲基戊二烯基乙基环戊二烯基钌)注入并蒸发为前驱体;用氩气洗涤;将O 2作为反应物注入反应器;并用氩气洗涤。; COPYRIGHT KIPO 2012

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