首页> 外国专利> PLASMA PROCESSING APPARATUS AND A PLASMA PROCESSING METHOD CAPABLE OF MINIMIZING DAMAGE TO A DIELECTRIC WINDOW DUE TO HYDROGEN IONS

PLASMA PROCESSING APPARATUS AND A PLASMA PROCESSING METHOD CAPABLE OF MINIMIZING DAMAGE TO A DIELECTRIC WINDOW DUE TO HYDROGEN IONS

机译:能够最小化氢离子对介电窗口的损伤的等离子体处理装置和等离子体处理方法

摘要

PURPOSE: A plasma processing apparatus and a plasma processing method are provided to suppress damage to a high frequency coil due to heat from plasma.;CONSTITUTION: A plasma generating chamber generates plasma by exciting process gas. A plasma processing chamber(20) is connected to the plasma generating chamber. A holder(15) is arranged in the plasma processing chamber. A high frequency antenna(140) is installed outside a dielectric window(13). A high frequency power source(150) applies high frequency power to a high frequency antenna.;COPYRIGHT KIPO 2012
机译:目的:提供一种等离子体处理装置和等离子体处理方法,以抑制由于来自等离子体的热量对高频线圈的损害。;组成:等离子体产生室通过激发处理气体产生等离子体。等离子体处理室(20)连接到等离子体产生室。支架(15)布置在等离子体处理室中。高频天线(140)安装在介电窗(13)的外部。高频电源(150)向高频天线施加高频功率。; COPYRIGHT KIPO 2012

著录项

  • 公开/公告号KR20120086264A

    专利类型

  • 公开/公告日2012-08-02

    原文格式PDF

  • 申请/专利权人 TOKYO ELECTRON LIMITED;

    申请/专利号KR20120006776

  • 发明设计人 NISHIMURA EIICHI;TAHARA SHIGERU;

    申请日2012-01-20

  • 分类号H01L21/3065;

  • 国家 KR

  • 入库时间 2022-08-21 17:09:26

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