首页> 外国专利> GRAPHENE INSPECTING DEVICE AND A GRAPHENE INSPECTING SYSTEM USING THE SAME, CAPABLE OF DETECTING THE EXISTENCE OF DEFECTS OF A GRAPHENE OF A LARGE AREA IN SHORT TIME

GRAPHENE INSPECTING DEVICE AND A GRAPHENE INSPECTING SYSTEM USING THE SAME, CAPABLE OF DETECTING THE EXISTENCE OF DEFECTS OF A GRAPHENE OF A LARGE AREA IN SHORT TIME

机译:使用相同的石墨烯检查装置和石墨烯检查系统,能够在短时间内检测出大面积的石墨烯的缺陷

摘要

PURPOSE: A graphene inspecting device and a graphene inspecting system using the same are provided to detects defects of a grapheme in short time with a simple configuration, thereby enhancing the efficiency of a grapheme quality inspection of a large area massively produced.;CONSTITUTION: A graphene inspecting device comprises a current applying unit(110), a data acquisition unit(120), and a detecting unit(130). The current applying unit applies current to a grapheme. The data acquisition unit obtains heat distribution data of the grapheme in which the current is applied. The detecting unit detects the existence of the defects of the grapheme based on the heat distribution data.;COPYRIGHT KIPO 2012
机译:目的:提供一种石墨烯检查装置和使用该石墨烯检查装置的石墨烯检查系统,以简单的结构在短时间内检测石墨烯的缺陷,从而提高大批量生产的大面积石墨烯质量的检查效率。石墨烯检查装置包括电流施加单元(110),数据获取单元(120)和检测单元(130)。电流施加单元将电流施加到字素。数据获取单元获得其中施加了电流的字素的热分布数据。检测单元基于热分布数据检测字素的缺陷的存在。; COPYRIGHT KIPO 2012

著录项

  • 公开/公告号KR20120094708A

    专利类型

  • 公开/公告日2012-08-27

    原文格式PDF

  • 申请/专利权人 SAMSUNG TECHWIN CO. LTD.;

    申请/专利号KR20110014141

  • 发明设计人 WON DONG KWAN;KIM NA YOUNG;

    申请日2011-02-17

  • 分类号G01N25/72;G01N25/20;

  • 国家 KR

  • 入库时间 2022-08-21 17:09:19

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号