Determination of crystallite size, number of graphene layers and defect density of graphene oxide (GO) and reduced graphene oxide (RGO)

摘要

Determination of crystallite size, number of graphene layers, interlayer spacing, and defect density with the use of X-ray diffraction and Raman spectroscopic technique. GO was synthesized by using Simple Hummer's method and was subjected to chemical reduction by using tri-sodium citrate. Particularly, the above parameters have presented by some mathematical equation usage. The shrinkage in the dimensions of crystallite upon reduction leads to decrease in number of graphene layers in each domain and clearly increase the defect density. XRD and Raman stated the formation of GO and its reduction to the formation of RGO.