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SEMICONDUCTOR DEVICE AND A MANUFACTURING METHOD THEREOF CAPABLE OF PROVIDING IMPROVED ELECTRICAL PROPERTY AND RELIABILITY

机译:能够提供改善的电气性能和可靠性的半导体装置及其制造方法

摘要

PURPOSE: A semiconductor device and a manufacturing method thereof are provided to obtain improved electrical property and reliability by selectively forming an insulation layer on one surface of a semiconductor substrate at low costs with a simple process.;CONSTITUTION: A substrate(10) having a first surface(11) and a second surface is prepared. A passivation layer(15) for exposing a part of a pad(14) is formed on the first surface of the substrate. A via hole(16) is formed to expose at least a part of the substrate from the first surface. A via hole insulation layer(22) is formed on a side wall of the via hole. A through-electrode(20) is formed in the via hole. The through-electrode comprises a barrier layer(24) and a conductive connection part(26).;COPYRIGHT KIPO 2012
机译:目的:提供一种半导体器件及其制造方法,其通过以简单的工艺低成本地在半导体衬底的一个表面上选择性地形成绝缘层来获得改善的电性能和可靠性。组成:具有衬底的衬底(10)准备第一表面(11)和第二表面。在基板的第一表面上形成用于暴露焊盘(14)的一部分的钝化层(15)。形成通孔(16)以从第一表面暴露至少一部分基板。在通孔的侧壁上形成通孔绝缘层(22)。在通孔中形成通电极(20)。贯通电极包括阻挡层(24)和导电连接部分(26)。; COPYRIGHT KIPO 2012

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