TEST DEVICE CAPABLE OF SIMPLIFYING A STRUCTURE BY OMITTING A LARGE SCALE CIRCUIT FOR A REMEDY SOLUTION

摘要

PURPOSE: A test device is provided to update a remedy solution in real time every time a new defective cell is detected.;CONSTITUTION: A test unit(20) sequentially tests each part in a memory area of a tested momory(200). A remedy solution memory(30) memorizes a remedy solution. The remedy solution displays the remedy and substitution of a detective part of the tested memory for a corresponding area of plural repair areas. If a new detective part is detected by the test unit in the test, an update unit(32) updates the memorized remedy solution into a remedy solution additionally remedying the new detective part.;COPYRIGHT KIPO 2013;[Reference numerals] (200) Tested memory; (22) Pattern generator; (24) Corrugation forming machine; (26) Logic comparator; (30) Remedy solution memory; (32) Update unit; (34) Plug memorizing unit; (36) Output unit; (AA) Input data; (BB) Address data; (CC) Applied signal; (DD) Outputted signal; (EE) Expected value data; (FF) Test unit; (GG) Address data; (HH) Fail data; (II) Test device