首页> 外国专利> LEAD FRAME FOR IMPROVING AN OPERATION RATE FOR PROCESS, A SEMICONDUCTOR PACKAGE, AND A FABRICATING METHOD THEREOF USING THE SAME

LEAD FRAME FOR IMPROVING AN OPERATION RATE FOR PROCESS, A SEMICONDUCTOR PACKAGE, AND A FABRICATING METHOD THEREOF USING THE SAME

机译:提高工艺操作率的铅骨架,半导体封装及其使用的制造方法

摘要

PURPOSE: A lead frame, a semiconductor package, and a fabricating method thereof using the same are provided to improve lamination quality by forming surface roughness on a lead frame raw material layer.;CONSTITUTION: Surface roughness is formed on a lead frame raw material layer(110). A first thin film plating layer(130) is formed on a part of the lead frame raw material layer. The surface roughness is formed to be in a range of 250 to 450 nanometers. A second thin film plating layer(150) has a thickness of 0.005 to 0.150 micrometers. The second thin film plating layer is formed on patterns of a wire bonding part.;COPYRIGHT KIPO 2013
机译:目的:提供引线框架,半导体封装及其制造方法,以通过在引线框架原材料层上形成表面粗糙度来提高层压质量。;构成:在引线框架原材料层上形成表面粗糙度(110)。在引线框原料层的一部分上形成第一薄膜镀层(130)。表面粗糙度形成为在250至450纳米的范围内。第二薄膜镀层(150)的厚度为0.005至0.150微米。在引线接合部分的图案上形成第二薄膜镀层。; COPYRIGHT KIPO 2013

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号