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Conductive carbon nanotube tip, probe of scanning probe microscope comprising the same and manufacturing method of the conductive carbon nanotube tip
Conductive carbon nanotube tip, probe of scanning probe microscope comprising the same and manufacturing method of the conductive carbon nanotube tip
A conductive carbon nanotube tip and a manufacturing method thereof are provided. The conductive carbon nanotube tip includes a carbon nanotube tip substantially vertically placed on a substrate, and a ruthenium coating layer covering a surface of the carbon nanotube tip and extending to at least a part of the substrate. The manufacturing method includes substantially vertically placing a carbon nanotube tip on a substrate, and forming a ruthenium coating layer on the carbon nanotube tip and at least a part of the substrate.
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