SE OF MULTI-WALLED CARBON NANOTUBES FOR CONDUCTIVE PROBE SCANNING FORCE MICROSCOPY (CP-SFM)

摘要

Multi-Walled Carbon Nanotubes (MWNTs) mounted on commercial Scanning Force Microscopy (SFM) cantilevers have proven to be excellent probes for high resolution Tapping Mode-Scanning Force Microscopy (TM-SFM). Because of their robust nature and high electrical conductance, MWNTs are also attractive for use in Conductive Probe-Scanning Force Microscopy (CP-SFM). To be used in this application, however, the MWNT must be mounted via a high conductance contact to a conductive cantilever. A technique has been developed that produces such a contact. First, a MWNT is attached using acrylic adhesive to a commercial SFM cantilever that has been vacuum coated with gold. Then, a cap of gold is deposited over the junction between the MWNT and the SFM cantilever via spatially selective electro-deposition.