Arrangement for the nondestructive testing of microwave-supported

摘要

Arrangement for the nondestructive testing of microwave-supported,consisting of a microwave - zfp - device (1), which operates according to the homodyne - principle,a quadrature - amplitudes - modulator (4)as well as an eddy current test device (2),in the case of which the microwaves - zfp - device (1) two outputs for defect information carrier end signals (x, y) has,during the quadrature - amplitudes - modulator (4) a 90° - phase shifter (12), two multipliers (13, 14) as well as an adder (15) comprises,a multiplier (13) of the quadrature - amplitudes - modulator (4) on the input side with one of the outputs for defect information carrier end signals (x) of the microwaves - zfp - device (1) is connected, while its other input is connected to the from the 90° - phase shifter (12) phase-shifted output signal of the eddy current test device (2) is occupied,the second multiplier (14) on the input side with the other of the outputs for defect information carrier end signals (y) of the microwaves - zfp - device (1) is connected, while its other input is connected to the unchanged output signal of the eddy current test device (2) is occupiedand the outputs of the multiplier (13, 14) to the inputs of the adder (15) whose output is connected to the input of..