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Measuring probe for measuring properties of substrate, has heating unit and temperature sensors that are arranged on main portion, to detect thermodynamic properties of to-be-examined substrate

机译:用于测量基材性能的测量探针,在主要部分上具有加热单元和温度传感器,以检测要检查的基材的热力学性能

摘要

The measuring probe has a main portion (100) with a pressure-measuring unit (1) that detects storage density of to-be-examined substrate (U). The heating unit (2) and temperature sensors (3,3') are arranged on the main portion, to detect the thermodynamic properties of to-be-examined substrate. An independent claim is included for method for measuring properties of substrate.
机译:该测量探针的主要部分(100)具有压力测量单元(1),该压力测量单元检测待检查的基板(U)的存储密度。加热单元(2)和温度传感器(3,3')布置在主要部分上,以检测待检查基板的热力学性质。包括独立权利要求以用于测量基材的性质的方法。

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