Determination of elongation tensor, lattice parameter and/or orientation matrix of crystallites in polycrystalline material involves using images of to-be-measured crystallite and reference crystallite based on atomic positions

摘要

Images of to-be-measured crystallite and reference crystallite are used for determination of elongation tensor, lattice parameter and/or orientation matrix of crystallites in polycrystalline material, based on atomic positions or overall coordinates of to-be-measured crystallite and reference crystallite, along at least three pairs of zone axes. Each pair of respective connection line between measuring point of crystallite and image of zone axis on detector has same direction.