首页> 外国专利> Method for calibrating complementary metal oxide semiconductor image sensor, involves determining mean value of specific pixel from at least two images of pixel, where mean values of other images are not included in determination process

Method for calibrating complementary metal oxide semiconductor image sensor, involves determining mean value of specific pixel from at least two images of pixel, where mean values of other images are not included in determination process

机译:校准互补金属氧化物半导体图像传感器的方法,涉及从至少两个像素图像确定特定像素的平均值,其中在确定过程中不包括其他图像的平均值

摘要

The method involves calculating correction gray values for a pixel of CMOS image sensor based on reference gray value of the pixel, and determining mean value (33) of the correction gray values. The mean value of a specific pixel is determined from at least two images of the pixel, where mean values of other images are not included in the determination of mean value of specific pixel. An independent claim is included for device for calibrating image sensor.
机译:该方法包括基于像素的参考灰度值计算CMOS图像传感器的像素的校正灰度值,并确定校正灰度值的平均值(33)。从像素的至少两个图像确定特定像素的平均值,其中在确定特定像素的平均值中不包括其他图像的平均值。包括用于校准图像传感器的设备的独立权利要求。

著录项

  • 公开/公告号DE102011006507A1

    专利类型

  • 公开/公告日2012-05-10

    原文格式PDF

  • 申请/专利权人 SIEMENS AKTIENGESELLSCHAFT;

    申请/专利号DE20111006507

  • 发明设计人 STOWASSER BORIS;

    申请日2011-03-31

  • 分类号H04N5/325;H04N5/232;G06T1;

  • 国家 DE

  • 入库时间 2022-08-21 17:05:05

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