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Device for monitoring overcurrent of self-conducting semiconductor switch i.e. junction FET, has monitoring circuit that produces electrical signal when test voltage exceeds preset threshold value during conductive phase of switch
Device for monitoring overcurrent of self-conducting semiconductor switch i.e. junction FET, has monitoring circuit that produces electrical signal when test voltage exceeds preset threshold value during conductive phase of switch
The device has a driver circuit for producing control signals for a control electrode of a self-conducting semiconductor switch (12). An upper driver potential (18) of a driver voltage supply (10) is connected with a source electrode (12b) of the switch. A production device produces test voltage (13) outside a supply voltage range of the driver circuit in a test line (14) that is connected with a drain electrode (12a) of the switch. A monitoring circuit produces an electrical signal when the test voltage exceeds a preset threshold value during a conductive phase of the switch. An independent claim is also included for a method for detecting an overcurrent condition in a self-conducting semiconductor switch.
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