首页> 外国专利> CALIBRATION SAMPLE FOR FLUORESCENT X-RAY ANALYSIS, FLUORESCENT X-RAY ANALYZER WITH THE SAME AND FLUORESCENT X-RAY ANALYSIS METHOD USING THE SAME

CALIBRATION SAMPLE FOR FLUORESCENT X-RAY ANALYSIS, FLUORESCENT X-RAY ANALYZER WITH THE SAME AND FLUORESCENT X-RAY ANALYSIS METHOD USING THE SAME

机译:荧光X射线分析的校准样品,相同的荧光X射线分析仪以及使用相同的荧光X射线分析方法

摘要

PROBLEM TO BE SOLVED: To provide a calibration sample or the like for fluorescent X-ray analysis of a liquid sample, which can be used for a long time and in which accurate drift calibration can be performed.;SOLUTION: A calibration sample 20 is a solid-state calibration sample for calibrating aging in measured X-ray intensity of an analysis target metal element in fluorescent X-ray analysis of a liquid sample S. In the calibration sample 20, a metal layer 21 containing the analysis target metal element is formed while overlapping a light element layer 22 in which at least one light element of hydrogen, boron, carbon, nitrogen, oxygen and fluorine has a maximum mol fraction and of which the thickness is 1 mm or more. In the metal layer 21, a surface at the side opposite to a surface confronted with the light element layer 22 is used as an analysis surface 23.;COPYRIGHT: (C)2013,JPO&INPIT
机译:解决的问题:提供用于液体样品的荧光X射线分析的校准样品等,其可以长期使用并且可以执行准确的漂移校准。;解决方案:校准样品20是用于在液体样品S的荧光X射线分析中用于校准分析目标金属元素的测量的X射线强度中的老化的固态校准样品。在校准样品20中,包含分析目标金属元素的金属层21为形成为与轻元素层22重叠,其中轻元素层22中的氢,硼,碳,氮,氧和氟中的至少一种轻元素具有最大摩尔分数,并且其厚度为1mm以上。在金属层21中,将与轻元素层22相对的面的相反侧的面作为分析面23。版权所有:(C)2013,JPO&INPIT

著录项

  • 公开/公告号JP2013088216A

    专利类型

  • 公开/公告日2013-05-13

    原文格式PDF

  • 申请/专利权人 RIGAKU CORP;

    申请/专利号JP20110227624

  • 发明设计人 KOBAYASHI HIROSHI;

    申请日2011-10-17

  • 分类号G01N23/223;

  • 国家 JP

  • 入库时间 2022-08-21 17:01:47

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