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NON-CONTACT DISTORTION MEASURING DEVICE AND NON-CONTACT DISTORTION MEASURING METHOD

机译:非接触式变形测量装置及非接触式变形测量方法

摘要

PROBLEM TO BE SOLVED: To provide a non-contact distortion measuring device and a non-contact distortion measuring method that secure a sufficient measurement range from an elastic deformation area to a plastic deformation area for one imaging part, and can highly accurately measure distortion at least in the elastic deformation area.;SOLUTION: According to the present invention, in image data of a test piece 2 captured by an imaging part 3, two reference points M1 and M2 in an imaging visual field 6 of the imaging part 3 are used as calculation data to calculate a predetermined physical quantity ε about distortion of the test piece 2. When at least one of two reference points M1 and M2 used as the calculation data arrives at a predetermined setting area or a value based on positions of areas of the two reference points arrives at a predetermined setting value, a reference point 23 to be used as the calculation data is switched over to two reference points M3 and M4 present in the imaging visual field 6 and the predetermined physical quantity ε is calculated from these switched-over two reference points M3 and M4.;COPYRIGHT: (C)2014,JPO&INPIT
机译:解决的问题:提供一种非接触畸变测量装置和非接触畸变测量方法,其确保对于一个成像部件的从弹性变形区域到塑性变形区域的足够的测量范围,并且可以高精度地测量解决方案:根据本发明,在由成像部件3捕获的测试件2的图像数据中,两个参考点M 1 和M 2 <成像部分3的成像视野6中的/ Sub>用作计算数据以计算关于测试件2的变形的预定物理量ε。当两个参考点M 1 和M 2 用作计算数据到达预定的设置区域,或者基于两个参考点的区域位置的值达到预定的设置值,参考点23将用作计算数据切换到两个参考成像视野6中存在的色点M 3 和M 4 ,并且从这些切换的两个参考点M 3 < / Sub>和M 4 。;版权所有:(C)2014,JPO&INPIT

著录项

  • 公开/公告号JP2013221778A

    专利类型

  • 公开/公告日2013-10-28

    原文格式PDF

  • 申请/专利权人 KOBELCO KAKEN:KK;

    申请/专利号JP20120091873

  • 发明设计人 YONEDA YASUSHI;NAKAMICHI DAISUKE;

    申请日2012-04-13

  • 分类号G01B11/16;G01N3/06;

  • 国家 JP

  • 入库时间 2022-08-21 17:01:39

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