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NON-CONTACT TYPE DISTORTION MEASURING APPARATUS, AND NON-CONTACT TYPE DISTORTION MEASURING METHOD

机译:非接触型失真测量装置及非接触型失真测量方法

摘要

PROBLEM TO BE SOLVED: To provide a non-contact type distortion measuring apparatus, and a non-contact type distortion measuring method for accurately measuring a predetermined physical amount regarding distortion of a specific area when the distortion is concentrated on the area in a test piece.;SOLUTION: The present invention includes: an imaging part 3 which captures an image of a test piece 2 to be measured; and physical amount derivation parts 50, 50B which detect an area Ar on which distortion is concentrated in the test piece 2 from image data on the test piece 2 acquired by the imaging part 3, to calculate predetermined physical amounts ε, εw regarding the distortion of the test piece 2 in the area Ar.;COPYRIGHT: (C)2014,JPO&INPIT
机译:解决的问题:提供一种非接触型畸变测量装置和非接触型畸变测量方法,用于当畸变集中在试件的区域上时,精确地测量关于特定区域的畸变的预定物理量。解决方案:本发明包括:成像部分3,其捕获要测量的测试件2的图像;以及成像部分3。物理量导出部50、50B,其从由摄像部3获取的试片2的图像数据中检测出在试片2中集中了畸变的区域Ar,算出规定的物理量ε,ε关于Ar区域中试件2的变形; COPYRIGHT:(C)2014,JPO&INPIT

著录项

  • 公开/公告号JP2013210274A

    专利类型

  • 公开/公告日2013-10-10

    原文格式PDF

  • 申请/专利权人 KOBELCO KAKEN:KK;

    申请/专利号JP20120080507

  • 发明设计人 YONEDA YASUSHI;NAKAMICHI DAISUKE;

    申请日2012-03-30

  • 分类号G01N3/00;G01B11/16;

  • 国家 JP

  • 入库时间 2022-08-21 17:01:24

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