首页> 外国专利> LIGHT EMISSION LABELER FOR SUPER-RESOLUTION MICROSCOPE AND SUPER-RESOLUTION MICROSCOPE

LIGHT EMISSION LABELER FOR SUPER-RESOLUTION MICROSCOPE AND SUPER-RESOLUTION MICROSCOPE

机译:超分辨显微镜和超分辨显微镜的发光标签

摘要

PROBLEM TO BE SOLVED: To provide a light emission labeler for a super-resolution microscope capable of efficiently suppressing light emission with erase light of low intensity and constituting the super-resolution microscope in an inexpensive and compact manner.;SOLUTION: A light emission labeler 1 for a super-resolution microscope to be used to dye a sample by partially overlapping pump light and erase light to concentrate the light on the sample with a super-resolution microscope so that a light response signal emitted from the sample might may be detected is configured by including polar response dye molecules 3 in a hydrophobic environment of a molecular aggregate 2.;COPYRIGHT: (C)2013,JPO&INPIT
机译:解决的问题:提供一种用于超分辨率显微镜的发光标记器,该标记器能够以低强度且紧凑的方式有效地抑制低强度的擦除光的发光并构成该超分辨率显微镜。图1中的超分辨率显微镜用于通过部分重叠泵浦光使样品染色并用超分辨率显微镜擦除光以将光聚集在样品上,从而可以检测到样品发出的光响应信号。通过在分子聚集体2的疏水环境中包含极性响应染料分子3来配置; COPYRIGHT:(C)2013,JPO&INPIT

著录项

  • 公开/公告号JP2013145201A

    专利类型

  • 公开/公告日2013-07-25

    原文格式PDF

  • 申请/专利权人 OLYMPUS CORP;

    申请/专利号JP20120006304

  • 发明设计人 IKETAKI YOSHINORI;

    申请日2012-01-16

  • 分类号G01N21/64;G02B21/06;

  • 国家 JP

  • 入库时间 2022-08-21 17:01:34

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