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STRAIGHTNESS MEASURING DEVICE AND STRAIGHTNESS MEASURING METHOD
STRAIGHTNESS MEASURING DEVICE AND STRAIGHTNESS MEASURING METHOD
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机译:直度测量装置和直度测量方法
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摘要
PROBLEM TO BE SOLVED: To provide a straightness measuring device and a straightness measuring method capable of accurately measuring straightness of a movement locus of a coating nozzle even when a substrate increases in size.SOLUTION: A straightness measurement device comprises a laser spectroscopic interferometer 14 and a mirror M. The mirror M is arranged at a position opposing to the laser spectroscopic interferometer 14 arranged on a coating head 20, in a state a reflection surface of the mirror M is parallel to a main scan direction guide section 31. The surface of the mirror M has high flatness. At this time, a distance between the reflection surface of the mirror M and the laser spectroscopic interferometer 14 is 1 mm or less. The mirror M is arranged on the entire area of application of a coating liquid by nozzles 23 associated with the movement of the coating head 20 in a main scan direction.
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