MEMORY TEST DEVICE, MEMORY TEST METHOD AND MEMORY TEST PROGRAM

摘要

PROBLEM TO BE SOLVED: To provide a memory test device capable of reusing a page-blocked memory area address space, and preventing a fault from becoming latent.SOLUTION: When occurrence of a correctable fault is detected in a memory during operation of an information processor, a memory area address space including a memory address at which the fault has occurred is registered as a fault occurrence page. When the information processor is started next time, a prescribed special memory test is executed to the registered fault occurrence page (step B105), and when the fault is detected (Yes in step B106), the fault occurrence page is set to a page blocked state so that it cannot be used by an OS after start (step B107), and test information in which the fault is detected is held (step B108). On the other hand, when the fault is not detected (No in step B106), the fault occurrence page is restored to such a state that it can be used by the OS after the start as a normal memory address space.