Memory testing device, a memory testing method, and a memory test program

摘要

PROBLEM TO BE SOLVED: To enable distinction of the cause of a bit error occurring in a memory between retention failure and otherwise.SOLUTION: A memory inspection device inspects an inspection object memory in which a bit error due to retention failure is likely to occur. The memory inspection device includes: bit error detection means for detecting a bit error in a prescribed region of the inspection object memory; and control means for rewriting a bit in the prescribed region into a value for continuously detecting occurrence of the retention failure as a bit error when a bit error is detected in the prescribed region, and calculating an occurrence interval of the bit errors.